Invention Application
- Patent Title: QUANTITATIVE SECONDARY ELECTRON DETECTION
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Application No.: US15521278Application Date: 2015-10-21
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Publication No.: US20170309445A1Publication Date: 2017-10-26
- Inventor: Jyoti Agrawal , David C. Joy , Subuhadarshi Nayak
- Applicant: ScienceTomorrow
- International Application: PCT/US15/56787 WO 20151021
- Main IPC: H01J37/244
- IPC: H01J37/244 ; H01J37/28 ; H01J37/285

Abstract:
Quantitative Secondary Electron Detection (QSED) using the array of solid state devices (SSD) based electron-counters enable critical dimension metrology measurements in materials such as semiconductors, nanomaterials, and biological samples (FIG. 3). Methods and devices effect a quantitative detection of secondary electrons with the array of solid state detectors comprising a number of solid state detectors. An array senses the number of secondary electrons with a plurality of solid state detectors, counting the number of secondary electrons with a time to digital converter circuit in counter mode.
Public/Granted literature
- US10256071B2 Quantitative secondary electron detection Public/Granted day:2019-04-09
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