发明申请
- 专利标题: X-RAY DIFFRACTION APPARATUS
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申请号: US15668746申请日: 2017-08-04
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公开(公告)号: US20180052121A1公开(公告)日: 2018-02-22
- 发明人: Takeshi Osakabe , Tetsuya Ozawa
- 申请人: Rigaku Corporation
- 优先权: JPJP2016-160316 20160818
- 主分类号: G01N23/20
- IPC分类号: G01N23/20 ; G01N23/201 ; G01N23/207
摘要:
An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.
公开/授权文献
- US10900913B2 X-ray diffraction apparatus 公开/授权日:2021-01-26
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