Invention Application
- Patent Title: X-RAY DIFFRACTION APPARATUS
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Application No.: US15668746Application Date: 2017-08-04
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Publication No.: US20180052121A1Publication Date: 2018-02-22
- Inventor: Takeshi Osakabe , Tetsuya Ozawa
- Applicant: Rigaku Corporation
- Priority: JPJP2016-160316 20160818
- Main IPC: G01N23/20
- IPC: G01N23/20 ; G01N23/201 ; G01N23/207

Abstract:
An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.
Public/Granted literature
- US10900913B2 X-ray diffraction apparatus Public/Granted day:2021-01-26
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