Invention Application
- Patent Title: METHOD AND ASSEMBLY FOR DETERMINING THE CARBON CONTENT IN SILICON
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Application No.: US15716598Application Date: 2017-09-27
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Publication No.: US20180088042A1Publication Date: 2018-03-29
- Inventor: Naveen Goud GANAGONA , Moriz JELINEK , Helmut OEFNER , Hans-Joachim SCHULZE , Werner SCHUSTEREDER
- Applicant: Infineon Technologies AG
- Priority: DE102016118204.4 20160927
- Main IPC: G01N21/3563
- IPC: G01N21/3563

Abstract:
A method of determining the carbon content in a silicon sample may include: generating electrically active polyatomic complexes within the silicon sample. Each polyatomic complex may include at least one carbon atom. The method may further include: determining a quantity indicative of the content of the generated polyatomic complexes in the silicon sample, and determining the carbon content in the silicon sample from the determined quantity.
Public/Granted literature
- US10317338B2 Method and assembly for determining the carbon content in silicon Public/Granted day:2019-06-11
Information query
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