- 专利标题: Internal Spacers for Nanowire Semiconductor Devices
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申请号: US15907878申请日: 2018-02-28
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公开(公告)号: US20180254321A1公开(公告)日: 2018-09-06
- 发明人: Kurt Wostyn , Hans Mertens , Liesbeth Witters , Andriy Hikavyy , Naoto Horiguchi
- 申请人: IMEC VZW
- 申请人地址: BE Leuven
- 专利权人: IMEC VZW
- 当前专利权人: IMEC VZW
- 当前专利权人地址: BE Leuven
- 优先权: EP17159054.0 20170303
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/66 ; H01L21/8234 ; H01L29/08
摘要:
A method of forming an internal spacer between nanowires, the method involving: providing a fin comprising a stack of layers of sacrificial material alternated with nanowire material, and selectively removing part of the sacrificial material, thereby forming a recess. The method also involves depositing dielectric material into the recess resulting in dielectric material within the recess and excess dielectric material outside the recess, where a crevice remains in the dielectric material in each recess, and removing the excess dielectric material using a first etchant. The method also involves enlarging the crevices to form a gap using a second etchant such that a remaining dielectric material still covers the sacrificial material and partly covers the nanowire material, and such that outer ends of the nanowire material are accessible; and growing electrode material on the outer ends such that the electrode material from neighboring outer ends merge, thereby covering the gap.
公开/授权文献
- US10361268B2 Internal spacers for nanowire semiconductor devices 公开/授权日:2019-07-23
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