Invention Application
- Patent Title: METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
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Application No.: US16404749Application Date: 2019-05-07
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Publication No.: US20190280106A1Publication Date: 2019-09-12
- Inventor: Yu-Ying Lin , Yi-Liang Ye , Sung-Yuan Tsai , Chun-Wei Yu , Yu-Ren Wang , Zhen Wu , Tai-Yen Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Priority: CN201810188894.X 20180308
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/768 ; H01L21/3065 ; H01L21/306 ; H01L21/285 ; H01L29/08 ; H01L29/78 ; H01L21/265

Abstract:
A method for fabricating semiconductor device includes the steps of: forming a first gate structure on a substrate; performing a first etching process to form a recess adjacent to the first gate structure; performing an ion implantation process to form an amorphous layer directly under the recess; performing a second etching process to remove the amorphous layer; and forming an epitaxial layer in the recess.
Public/Granted literature
- US10446667B2 Method for fabricating semiconductor device Public/Granted day:2019-10-15
Information query
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