Invention Application
- Patent Title: ULTRASONIC EXAMINATION DEVICE AND ULTRASONIC PROBE
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Application No.: US16245605Application Date: 2019-01-11
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Publication No.: US20190321000A1Publication Date: 2019-10-24
- Inventor: Taiichi TAKEZAKI , Hiroaki HASEGAWA , Shuntaro MACHIDA , Ryo IMAI , Tomohiko TANAKA
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Priority: JP2018-080728 20180419
- Main IPC: A61B8/00
- IPC: A61B8/00 ; B06B1/02 ; H04R19/00

Abstract:
Performance of an ultrasonic examination device, which includes an ultrasonic sensor of a capacitance detection type including a cavity between electrodes and vibrating a membrane, is enhanced. A cell which is a capacitive type device provided with a lower electrode, a cavity, and an upper electrode in a membrane, which are stacked in a longitudinal direction, and a condenser provided with the lower electrode and an upper electrode which are stacked in the longitudinal direction, are formed in one semiconductor chip. The cell and the condenser are connected to each other in parallel, and, when ultrasonic waves are transmitted and received using the cell, connection between a DC bias power source and the semiconductor chip is blocked, and a direct current voltage is applied to the cell from the condenser.
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