• 专利标题: High-Speed Data Transfer Periods for Thyristor Memory Cell Arrays
  • 申请号: US16124133
    申请日: 2018-09-06
  • 公开(公告)号: US20190378554A1
    公开(公告)日: 2019-12-12
  • 发明人: Bruce L. Bateman
  • 申请人: TC Lab, Inc.
  • 主分类号: G11C11/16
  • IPC分类号: G11C11/16 G11C13/00
High-Speed Data Transfer Periods for Thyristor Memory Cell Arrays
摘要:
Aspects of DDR and thyristor memory cell RAMs are optimally combined for high-speed data transfer into and out of RAMs. After a Read operation in which data from a selected row of memory cells in an array are latched, a Burst operation selectively moves the latched data from the array or latches external data. At the same time as the Burst data transfer, all the memory cells of the selected row are turned off or on by a write operation. In the following Write-Back & Pre-charge operation, the latched data bits which are complementary to the memory cell state of the Burst write operation are written back into the corresponding memory cells in the selected row. As part of a DDR-like activation cycle, data can be transferred to and from the memory cell array RAM at high-speed.
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