Invention Application
- Patent Title: Low-K Gate Spacer and Formation Thereof
-
Application No.: US16674443Application Date: 2019-11-05
-
Publication No.: US20200075419A1Publication Date: 2020-03-05
- Inventor: Bo-Cyuan Lu , Chunyao Wang , Jr-Hung Li , Chung-Ting Ko , Chi On Chui
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L29/66 ; H01L27/088 ; H01L29/423 ; H01L29/417 ; H01L29/78

Abstract:
Gate structures and gate spacers, along with methods of forming such, are described. In an embodiment, a structure includes an active area on a substrate, a gate structure on the active area and over the substrate, and a low-k gate spacer on the active area and along a sidewall of the gate structure. The gate structure includes a conformal gate dielectric on the active area and includes a gate electrode over the conformal gate dielectric. The conformal gate dielectric extends vertically along a first sidewall of the low-k gate spacer. In some embodiments, the low-k gate spacer can be formed using a selective deposition process after a dummy gate structure has been removed in a replacement gate process.
Public/Granted literature
- US10854521B2 Low-k gate spacer and formation thereof Public/Granted day:2020-12-01
Information query
IPC分类: