Invention Application
- Patent Title: OPTIMIZED SCAN INTERVAL
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Application No.: US16749481Application Date: 2020-01-22
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Publication No.: US20200160894A1Publication Date: 2020-05-21
- Inventor: Kishore Kumar Muchherla , Ashutosh Malshe , Harish Reddy Singidi , Gianni Stephen Alsasua , Gary F. Besinga , Sampath Ratnam , Peter Sean Feeley
- Applicant: Micron Technology, Inc.
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C29/02 ; G11C8/10

Abstract:
A variety of applications can include apparatus and/or methods of operating the apparatus that include a memory device having read levels that can be calibrated. A calibration controller implemented with the memory device can trigger a read level calibration based on inputs from one or more trackers monitoring parameters associated with the memory device and a determination of an occurrence of at least one event from a set of events related to the monitored parameters. The monitored parameters can include parameters related to a selected time interval and measurements of read, erase, or write operations of the memory device. Additional apparatus, systems, and methods are disclosed.
Public/Granted literature
- US11056156B2 Optimized scan interval Public/Granted day:2021-07-06
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