Invention Application
- Patent Title: METHOD FOR STRUCTURING A NITRIDE LAYER, STRUCTURED DIELECTRIC LAYER, OPTOELECTRONIC COMPONENT, ETCHING METHOD FOR ETCHING LAYERS, AND AN ENVIRONMENT SENSOR
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Application No.: US16714447Application Date: 2019-12-13
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Publication No.: US20200168472A1Publication Date: 2020-05-28
- Inventor: Andreas RUECKERL , Roland ZEISEL , Simeon KATZ
- Applicant: OSRAM Opto Semiconductors GmbH
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@557a4c16
- Main IPC: H01L21/3213
- IPC: H01L21/3213 ; H01L31/0304 ; H01S5/22 ; H01L33/44 ; H01L33/00 ; H01L31/0236 ; H01L31/0232 ; H01L21/02

Abstract:
The invention relates to a method for structuring a nitride layer (2), comprising the following steps: A) providing a nitride layer (2) formed with silicon nitride of a first type, B) defining regions (40) of said nitride layer (2) to be transformed, and C) inserting the nitride layer (2) into a transformation chamber for the duration of a transformation period, said transformation period being selected such that—at least 80% of the nitride layer (2) regions (40) to be transformed are transformed into oxide regions (41) formed with silicon oxide, and—remaining nitride layer (2) regions (21) remain at least 80% untransformed.
Information query
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