发明申请
- 专利标题： High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing
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申请号： US16901789申请日： 2020-06-15
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公开(公告)号： US20200313322A1公开(公告)日： 2020-10-01
- 发明人: Jeffrey Sherry , Michael Andres
- 申请人： Johnstech International Corporation
- 主分类号： H01R12/70
- IPC分类号： H01R12/70 ; H01R12/82 ; G01R1/04 ; G01R31/28 ; H01R13/24
摘要：
A test socket (14) for a testing an integrated circuit (12) with controlled impedance while maintaining the structural integrity of the test pins (20). The pin (20) can have a sidewall with a thick portion 32 and a thinner portion (30) along the length of the pin. The pin can have projections (42) which provide a standoff from the slot (40). The sidewalls themselves can have projections or lands (60, 61) which extend into the slot and provide stability for the pin (20).
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