Invention Application
- Patent Title: MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD
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Application No.: US16814036Application Date: 2020-03-10
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Publication No.: US20200328071A1Publication Date: 2020-10-15
- Inventor: Osamu FURUHASHI , Tomomi TAMURA , Kiyoshi OGAWA
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4e16839f
- Main IPC: H01J49/08
- IPC: H01J49/08 ; H01J49/04

Abstract:
A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.
Public/Granted literature
- US10930488B2 Mass spectrometer, sampling probe, and analysis method Public/Granted day:2021-02-23
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