ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

    公开(公告)号:US20200152441A1

    公开(公告)日:2020-05-14

    申请号:US16744290

    申请日:2020-01-16

    Abstract: A multipole ion guide (30) including a plurality of rod electrodes arranged at an angle to the central axis (C) is placed within a collision cell (13) located in the previous stage of an orthogonal accelerator (16). Radio-frequency voltages with opposite phases are applied to the rod electrodes of the ion guide (30) so that any two rod electrodes neighboring each other in the circumferential direction have opposite phases of the voltage. A depth gradient of the pseudopotential is thereby formed from the entrance end toward the exit end within the space surrounded by the rod electrodes, and ions are accelerated by this gradient. During an ion-accumulating process, a direct voltage having the same polarity as the ions is applied to the exit lens electrode (132) to form a potential barrier for accumulating ions. Among the ions repelled by the potential barrier, ions having smaller m/z return closer to the entrance end. Therefore, when the potential barrier is removed and ions are discharged, ions having smaller m/z are discharged at later points in time than those having larger m/z. Therefore, a wide m/z range of ions can be simultaneously accelerated and ejected by an orthogonal accelerator (16).

    MASS SPECTROMETER
    2.
    发明申请

    公开(公告)号:US20220236200A1

    公开(公告)日:2022-07-28

    申请号:US17645354

    申请日:2021-12-21

    Abstract: A mass spectrometer (1) includes: an ionization section (201) configured to generate ions from a sample; a mass separation section (231, 235) configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector (237) configured to detect an ion separated by the mass separation section; an ion capture section (31) configured to capture ions separated by the mass separation section; and an electron beam detection section (32) configured to detect an electron beam diffracted by ions captured within the ion capture section (31). This mass spectrometer is capable of performing, in a single measurement operation, both a mass spectrometric analysis and an electron-beam diffraction measurement for distinguishing between isomers. The electron-beam diffraction measurement can be more efficiently performed than in a conventional device of this type.

    Surface Analysis Method and Surface Analysis Apparatus

    公开(公告)号:US20250020603A1

    公开(公告)日:2025-01-16

    申请号:US18713522

    申请日:2022-05-31

    Inventor: Osamu FURUHASHI

    Abstract: A surface analysis apparatus includes: an ion irradiation unit configured to irradiate a surface of a solid sample with an ion stream of a specific ion species having a preset value of kinetic energy at a predetermined incident angle; an observation unit configured to observe scattered ions that originate from the ion stream and have undergone a charge transfer reaction with an atom or molecule present on a surface of the solid sample; and an information calculation unit configured to obtain information on electrical properties or physical properties on a surface of the solid sample on the basis of an observation result of the scattered ions in the observation unit. As a result, it is possible to efficiently acquire, in a short time, the distribution of the information on the electrical properties or physical properties such as the surface potential of the solid sample.

    ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

    公开(公告)号:US20190019664A1

    公开(公告)日:2019-01-17

    申请号:US16070088

    申请日:2016-01-15

    Abstract: A multipole ion guide (30) including a plurality of rod electrodes arranged at an angle to the central axis (C) is placed within a collision cell (13) located in the previous stage of an orthogonal accelerator (16). Radio-frequency voltages with opposite phases are applied to the rod electrodes of the ion guide (30) so that any two rod electrodes neighboring each other in the circumferential direction have opposite phases of the voltage. A depth gradient of the pseudopotential is thereby formed from the entrance end toward the exit end within the space surrounded by the rod electrodes, and ions are accelerated by this gradient. During an ion-accumulating process, a direct voltage having the same polarity as the ions is applied to the exit lens electrode (132) to form a potential barrier for accumulating ions. Among the ions repelled by the potential barrier, ions having smaller m/z return closer to the entrance end. Therefore, when the potential barrier is removed and ions are discharged, ions having smaller m/z are discharged at later points in time than those having larger m/z. Therefore, a wide m/z range of ions can be simultaneously accelerated and ejected by an orthogonal accelerator (16).

    ION ANALYZER
    6.
    发明申请

    公开(公告)号:US20220375739A1

    公开(公告)日:2022-11-24

    申请号:US17697045

    申请日:2022-03-17

    Abstract: In order to improve the ionization efficiency and ion collection efficiency in an ESI ion source to achieve a higher level of analysis sensitivity while improving the throughput of the analysis, one mode of the present invention provides an ion analyzer equipped with an ion source employing an electrospray ionization method, where the ion source (2) includes: a plurality of capillaries (211-218) configured to spray a supplied liquid sample in the same direction; one or more auxiliary electrodes (23, 231-328) arranged so as to be surrounded by the plurality of capillaries; and a voltage supplier (24) configured to apply, to the plurality of capillaries, a DC high voltage for which the potential of the one or more auxiliary electrodes is used as a reference.

    MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD

    公开(公告)号:US20200328071A1

    公开(公告)日:2020-10-15

    申请号:US16814036

    申请日:2020-03-10

    Abstract: A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.

    METHOD FOR ANALYZING OPTICAL ISOMERS AND ION MOBILITY ANALYZER

    公开(公告)号:US20190066992A1

    公开(公告)日:2019-02-28

    申请号:US16108182

    申请日:2018-08-22

    CPC classification number: H01J49/06 G01N21/19 G01N27/622

    Abstract: The existence ratio of optical isomers (D-form, L-form) is easily measured.Counterclockwise or clockwise circularly polarized light is applied from a light application unit 6 to ions which are derived from a target compound and are drifting in a drift region 3. The ions absorb light, and a collision cross-section of the ions thus changes, whereby the mobility also changes. Each of the D-form and the L-form has a light absorption rate which is different between counterclockwise circularly polarized light and clockwise circularly polarized light. Therefore, each light absorption rate is examined in advance, and an existence ratio of the D-form and the L-form is calculated, based on the two intensity ratios each of which is the ratio of a peak of the ions having absorbed no light and a peak of the ions having absorbed light, which peaks appear on a drift time spectrum, and based on the light absorption rates of the D-form and the L-form.

    TIME-OF-FLIGHT MASS SPECTROMETER
    9.
    发明申请

    公开(公告)号:US20170358440A1

    公开(公告)日:2017-12-14

    申请号:US15539229

    申请日:2014-12-24

    Inventor: Osamu FURUHASHI

    CPC classification number: H01J49/405 H01J37/266 H01J49/401 H01J49/424

    Abstract: An ion reflector has a configuration in which multiple plate electrodes having a rectangular opening are arranged. The components are arranged so that a central axial line extending in the longitudinal direction of the opening lies on a plane which contains a straight line (Y-axis) connecting the centroidal position of an ion distribution in an ion trap and a central position on the detection surface of a detector, and a central axial line (X-axis) of an ion-ejecting direction. If the potential distribution along the central axis of the ion reflector is modified so that a portion of the reflecting field becomes a non-uniform electric field intended for improving isochronism for a group of ions to be detected, an area having an ideal potential distribution for realizing the isochronism is spread in the Y-axis direction.

    ION RADIATION DEVICE AND SURFACE ANALYZER USING SAID DEVICE

    公开(公告)号:US20170154764A1

    公开(公告)日:2017-06-01

    申请号:US15334559

    申请日:2016-10-26

    CPC classification number: H01J49/401 H01J49/062 H01J49/10 H01J49/405

    Abstract: Used as an ion beam guiding unit for introducing primary ions to the surface of the sample is an ion optical system of reflectron TOFMS for achieving time focusing including an orthogonal acceleration unit for accelerating the ions in the orthogonal direction, a flight space of a non-electric field, and an ion reflector for forming a reflecting electric field. A dual stage type is used as the ion reflector to superimpose the correction potential showing a predetermined non-linear potential distribution on the potential having a linear gradient of a uniform electric field at the side deeper than the second order focusing position that fulfills the Mamyrin solution, thereby correcting the temporal spread of ion packets emitted from the orthogonal acceleration unit until the deviation of third or higher order in energy, achieving high time focusing.

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