公开(公告)号：US20200266046A1

公开(公告)日：2020-08-20

申请号：US16738129

申请日：2020-01-09

Applicant: SHIMADZU CORPORATION

Inventor： Osamu FURUHASHI ,  Junichi TANIGUCHI ,  Kiyoshi OGAWA

IPC: H01J49/42 ,  H01J49/00 ,  H01J49/08 ,  H01J49/24

Abstract: A mass spectrometer includes: a vacuum chamber; and an ion trap and a surface emission-type electron emissive element, the ion trap and the surface emission-type electron emissive element being disposed inside the vacuum chamber.

公开(公告)号：US20200328071A1

公开(公告)日：2020-10-15

申请号：US16814036

申请日：2020-03-10

Applicant: SHIMADZU CORPORATION

Inventor： Osamu FURUHASHI ,  Tomomi TAMURA ,  Kiyoshi OGAWA

IPC: H01J49/08 ,  H01J49/04

Abstract: A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.

公开(公告)号：US20210042943A1

公开(公告)日：2021-02-11

申请号：US16985700

申请日：2020-08-05

Applicant: Shimadzu Corporation

Inventor： Ryuta MATSUMOTO ,  Kiyoshi OGAWA ,  Tomomi TAMURA ,  Hiroki MAEDA

IPC: G06T7/40 ,  G06T11/60 ,  H01J37/22 ,  H01J37/29 ,  H01J37/285

Abstract: A scanning electron microscope is provided that is capable of displaying an image highly visible for a user when an image is displayed by visualization by combining morphological image information with component image information. A scanning electron microscope 1 for observing a sample S by irradiating the sample S with an electron ray, the scanning electron microscope 1 includes: a morphological calculation unit 24 configured to calculate intensity data of at least one of secondary electrons and reflected electrons obtained from the sample S to obtain morphological image information of the sample S; a component calculation unit 34 configured to calculate spectrum data of X-ray energy obtained from the sample S to obtain component image information of the sample S; and a display unit 50 configured to display an image visualized by combining the morphological image information with the component image information, wherein the morphological calculation unit 24 is configured to change the morphological image information in accordance with one or more morphological image parameters input by a user, and the component calculation unit 34 is configured to change the component image information in accordance with one or more component image parameters input by a user.

公开(公告)号：US20190189418A1

公开(公告)日：2019-06-20

申请号：US16226003

申请日：2018-12-19

Applicant: SHIMADZU CORPORATION

Inventor： Hiroyuki MIURA ,  Hideaki IZUMI ,  Kiyoshi OGAWA

IPC: H01J49/40 ,  H01J49/02

CPC classification number: H01J49/408 ,  H01J49/022 ,  H01J49/025

Abstract: A microchannel plate (MCP) 41 in an ion detection section 4 multiplies electrons. An anode 42 detects those electrons and produces a current signal. An amplifier 44 converts this signal into a voltage signal. A low-pass filter 5A acting as a smoothing section 5 is located at the output end of the amplifier 44. A waveform-shaping time adjuster 6 adjusts the time constant of the low-pass filter 5A beforehand according to the response time of the MCP 41, mass-to-charge ratio of an ion species to be subjected to the measurement, and duration of the spread of the ion species which depends on device-specific parameters. A plurality of peaks which sequentially appear in the detection signal corresponding to one ion species are thereby smoothed into a single broad peak. Thus, the distinguishability between signal waves and noise components is improved.

公开(公告)号：US20130171349A1

公开(公告)日：2013-07-04

申请号：US13674745

申请日：2012-11-12

Applicant: SHIMADZU CORPORATION

Inventor： Kazuteru TAKAHASHI ,  Kiyoshi OGAWA

IPC: C23C16/52

CPC classification number: C23C16/52 ,  C23C14/12 ,  C23C14/24 ,  C23C14/54 ,  C23C14/547 ,  C23C14/548 ,  G01B11/0625

Abstract: To provide a sample preparation device that is appropriate for the formation of a matrix film for MALDI through vacuum vapor deposition. A sample preparation device is provided with: a sample substrate support unit 23 for supporting a substance to be analyzed on a substrate S so that the substance faces a vapor deposition source 21 for a matrix substance J; a light amount measurement unit for irradiating a matrix film vapor deposited on the substrate S with measurement light diagonally and detecting the amount of measurement light that has transmitted through or has been reflected from the above-described matrix film diagonally; and an adhesion prevention means 23a for preventing the matrix substance that has flown off from the above-described vapor deposition source 21 from adhering to the above-described light amount measurement unit.

Abstract translation: 提供适于通过真空气相沉积形成用于MALDI的基质膜的样品制备装置。 样品制备装置具有：样品基板支撑单元23，用于在基板S上支撑待分析物质，使得物质面向基质物质J的气相沉积源21; 光量测量单元，其用测量光对角地照射沉积在基板S上的基质膜蒸气并检测已经透射或已经从上述矩阵膜反射的测量光的量; 以及用于防止从上述蒸镀源21流出的基质物质粘附于上述光量测定单元的防附着装置23a。