- 专利标题: SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
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申请号: US16722622申请日: 2019-12-20
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公开(公告)号: US20210005506A1公开(公告)日: 2021-01-07
- 发明人: Kyujin KIM , Hui-Jung KIM , Junsoo KIM , Sangho LEE , Jae-Hwan CHO , Yoosang HWANG
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2019-0079528 20190702
- 主分类号: H01L21/762
- IPC分类号: H01L21/762 ; H01L21/311 ; H01L21/8234 ; H01L29/66 ; H01L29/78 ; H01L29/423 ; H01L27/108
摘要:
A semiconductor device may include active patterns extended in a first direction and spaced apart from each other in the first direction, a device isolation layer defining the active patterns, an insulating structure provided between the active patterns and between the device isolation layer, and a gate structure disposed on the insulating structure and extended in a second direction crossing the first direction. The gate structure may include an upper portion and a lower portion. The lower portion of the gate structure may be enclosed by the insulating structure.
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