Invention Application
- Patent Title: SUPERLATTICE PHOTO DETECTOR
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Application No.: US16502108Application Date: 2019-07-03
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Publication No.: US20210005763A1Publication Date: 2021-01-07
- Inventor: He Lin , Sameer Pendharkar
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Main IPC: H01L31/0352
- IPC: H01L31/0352 ; H01L31/0224 ; H01L31/0216 ; H01L31/02 ; H01L27/144 ; H01L31/18 ; H01L31/0304 ; H01L25/04 ; H01L31/103

Abstract:
A photo detector includes a superlattice with an undoped first semiconductor layer including undoped intrinsic semiconductor material, a doped second semiconductor layer having a first conductivity type on the first semiconductor layer, an undoped third semiconductor layer including undoped intrinsic semiconductor material on the second semiconductor layer, and a fourth semiconductor layer having a second opposite conductivity type on the third semiconductor layer, along with a first contact having the first conductivity type in the first, second, third, and fourth semiconductor layers, and a second contact having the second conductivity type and spaced apart from the first contact in the first, second, third, and fourth semiconductor layers. An optical shield on a second shielded portion of a top surface of the fourth semiconductor layer establishes electron and hole lakes. A packaging structure includes an opening that allows light to enter an exposed first portion of the top surface of the fourth semiconductor layer.
Public/Granted literature
- US11158750B2 Superlattice photo detector Public/Granted day:2021-10-26
Information query
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