Invention Application
- Patent Title: MEGA-SONIC VIBRATION ASSISTED CHEMICAL MECHANICAL PLANARIZATION
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Application No.: US16516006Application Date: 2019-07-18
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Publication No.: US20210016415A1Publication Date: 2021-01-21
- Inventor: Chun-Hao Kung , Shang-Yu Wang , Ching-Hsiang Tsai , Hui-Chi Huang , Kei-Wei Chen
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: B24B37/10
- IPC: B24B37/10 ; B24B37/04 ; B24B37/32 ; H01L21/321 ; H01L21/3105

Abstract:
A method of performing a chemical mechanical planarization (CMP) process includes holding a wafer by a retainer ring attached to a carrier, pressing the wafer against a first surface of a polishing pad, the polishing pad rotating at a first speed, dispensing a slurry on the first surface of the polishing pad, and generating vibrations at the polishing pad.
Public/Granted literature
- US11590627B2 Mega-sonic vibration assisted chemical mechanical planarization Public/Granted day:2023-02-28
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