- 专利标题: PROTECTIVE BILAYER INNER SPACER FOR NANOSHEET DEVICES
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申请号: US16518153申请日: 2019-07-22
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公开(公告)号: US20210028297A1公开(公告)日: 2021-01-28
- 发明人: Yao Yao , Ruilong Xie , Andrew Greene , Veeraraghavan S. Basker
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L21/02 ; H01L21/306 ; H01L29/08 ; H01L29/40 ; H01L21/311 ; H01L21/308 ; H01L29/10 ; H01L29/06 ; H01L29/78
摘要:
A method for manufacturing a semiconductor device includes forming a plurality of first semiconductor layers alternately stacked with a plurality of second semiconductor layers on a semiconductor substrate, and laterally recessing the plurality of first semiconductor layers with respect to the plurality of second semiconductor layers to form a plurality of vacant areas on lateral sides of the plurality of first semiconductor layers. In the method, a plurality of first inner spacers are formed on the lateral sides of the plurality of first semiconductor layers in respective ones of the plurality of vacant areas, and a plurality of second inner spacers are formed on sides of the plurality of first inner spacers in the respective ones of the plurality of vacant areas. The method also includes laterally recessing the plurality of second semiconductor layers, and growing a plurality of source/drain regions from the plurality of second semiconductor layers.
公开/授权文献
- US11081568B2 Protective bilayer inner spacer for nanosheet devices 公开/授权日:2021-08-03
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