Invention Application
- Patent Title: SUBSTRATE PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
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Application No.: US17039295Application Date: 2020-09-30
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Publication No.: US20210098263A1Publication Date: 2021-04-01
- Inventor: Shinya ISHIKAWA , Toru HISAMATSU
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Priority: JP2019-181500 20191001
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01J37/32 ; H01L21/027

Abstract:
A method for processing a substrate for processing a substrate includes: (a) providing a substrate having an etching region and a patterned region on the etching region; (b) forming an organic film on a surface of the substrate; and (c) etching the etching region using plasma generated from a processing gas through the patterned region. The step (b) includes (b1) supplying a first gas containing an organic compound to the substrate to form a precursor layer on the substrate, and (b2) supplying a second gas containing a modifying gas to the substrate and supplying energy to the precursor layer and/or the second gas to modify the precursor layer.
Public/Granted literature
- US11469111B2 Substrate processing method and plasma processing apparatus Public/Granted day:2022-10-11
Information query
IPC分类: