Invention Application
- Patent Title: ONE SELECTOR ONE RESISTOR RAM THRESHOLD VOLTAGE DRIFT AND OFFSET VOLTAGE COMPENSATION METHODS
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Application No.: US17245651Application Date: 2021-04-30
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Publication No.: US20210249073A1Publication Date: 2021-08-12
- Inventor: Michael K. Grobis , Daniel Bedau
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C11/16 ; H01L27/22 ; H01L27/24

Abstract:
An apparatus is provided that includes a plurality of data arrays each comprising first memory cells, a plurality of read reference arrays each comprising second memory cells, a plurality of write reference arrays each comprising third memory cells, an access block comprising a memory cell from each of the plurality of data arrays, each of the plurality of read reference arrays, and each of the plurality of write reference arrays, and a memory controller. The memory controller is configured to determine a read threshold voltage to compensate a drift of a threshold voltage of the first memory cells, wherein the read threshold voltage is determined based on threshold voltages of a plurality of second memory cells, and a read offset voltage to compensate an offset voltage of the first memory cells, wherein the read offset voltage is determined based on offset voltages of a plurality of second memory cells.
Public/Granted literature
- US11355188B2 One selector one resistor RAM threshold voltage drift and offset voltage compensation methods Public/Granted day:2022-06-07
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