Invention Application
- Patent Title: SIMD Group Formation Techniques for Primitive Testing associated with Ray Intersect Traversal
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Application No.: US17103406Application Date: 2020-11-24
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Publication No.: US20220036638A1Publication Date: 2022-02-03
- Inventor: Ali Rabbani Rankouhi , Christopher A. Burns , Justin A. Hensley , Luca Iuliano , Jonathan M. Redshaw
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Main IPC: G06T15/06
- IPC: G06T15/06 ; G06T15/00

Abstract:
Disclosed techniques relate to primitive testing associated with ray intersection processing for ray tracing. In some embodiments, shader circuitry executes a first SIMD group that includes a ray intersect instruction for a set of rays. Ray intersect circuitry traverses, in response to the ray intersect instruction, multiple nodes in a spatially organized acceleration data structure (ADS). In response to reaching a node of the ADS that indicates one or more primitives, the apparatus forms a second SIMD group that executes one or more instructions to determine whether a set of rays that have reached the node intersect the one or more primitives. The shader circuitry may execute the first SIMD group to shade one or more primitives that are indicated as intersected based on results of execution of the second SIMD group. Thus, disclosed techniques may use both dedicated ray intersect circuitry and dynamically formed SIMD groups executed by shader processors to detect ray intersection.
Public/Granted literature
- US11436784B2 SIMD group formation techniques for primitive testing associated with ray intersect traversal Public/Granted day:2022-09-06
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |