Invention Application
- Patent Title: TRAINING FOR CHIP SELECT SIGNAL READ OPERATIONS BY MEMORY DEVICES
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Application No.: US17441667Application Date: 2019-05-24
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Publication No.: US20220148639A1Publication Date: 2022-05-12
- Inventor: Zhenglong WU , Tonia G. MORRIS , Christina JUE , Daniel BECERRA PEREZ , David G. ELLIS
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- International Application: PCT/CN19/88263 WO 20190524
- Main IPC: G11C11/4076
- IPC: G11C11/4076 ; G11C11/4096

Abstract:
A reference voltage value and a chip select (CS) signal timing delay provided to memory devices can be determined based on samples of the CS signal received by the memory devices. The CS signal can be provided to the memory devices with varying time delays and for various reference voltages. Various samples of the CS signal from the memory devices can indicate different times for rising and falling edges of the CS signal. A composite signal eye can be generated by the latest occurring rising edge and the earliest occurring falling edge of the CS signal. The reference voltage value and timing delay can be chosen based on the composite signal eye width that is the closest to a reference eye width.
Public/Granted literature
- US12009023B2 Training for chip select signal read operations by memory devices Public/Granted day:2024-06-11
Information query
IPC分类: