Invention Application
- Patent Title: Multi-Gate Devices and Fabricating the Same with Etch Rate Modulation
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Application No.: US17699362Application Date: 2022-03-21
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Publication No.: US20220208989A1Publication Date: 2022-06-30
- Inventor: Chih-Ching Wang , Chung-I Yang , Jon-Hsu Ho , Wen-Hsing Hsieh , Kuan-Lun Cheng , Chung-Wei Wu , Zhiqiang Wu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/8234 ; H01L29/78 ; H01L29/417

Abstract:
The present disclosure provides a semiconductor device and a method of manufacturing the semiconductor device. The semiconductor device includes channel members disposed over a substrate, a gate structure engaging the channel members, and an epitaxial feature adjacent the channel members. At least one of the channel members has an end portion in physical contact with an outer portion of the epitaxial feature. The end portion of the at least one of the channel members includes a first dopant of a first concentration. The outer portion of the epitaxial feature includes a second dopant of a second concentration. The first concentration is higher than the second concentration.
Public/Granted literature
- US11949001B2 Multi-gate devices and fabricating the same with etch rate modulation Public/Granted day:2024-04-02
Information query
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