• Patent Title: METHOD FOR MEASURING CONCENTRATION OF FLUORINE GAS IN HALOGEN FLUORIDE-CONTAINING GAS USING MASS SPECTROMETER
  • Application No.: US17608527
    Application Date: 2020-11-12
  • Publication No.: US20220223397A1
    Publication Date: 2022-07-14
  • Inventor: Atsushi SUZUKI
  • Applicant: SHOWA DENKO K.K.
  • Applicant Address: JP Tokyo
  • Assignee: SHOWA DENKO K.K.
  • Current Assignee: SHOWA DENKO K.K.
  • Current Assignee Address: JP Tokyo
  • Priority: JP2019-214260 20191127
  • International Application: PCT/JP2020/042274 WO 20201112
  • Main IPC: H01J49/04
  • IPC: H01J49/04 H01J49/40 H01J49/00
METHOD FOR MEASURING CONCENTRATION OF FLUORINE GAS IN HALOGEN FLUORIDE-CONTAINING GAS USING MASS SPECTROMETER
Abstract:
A method for measuring the concentration of fluorine gas (F2) contained in a halogen fluoride-containing gas using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method including, before measuring the concentration of fluorine gas, performing passivation treatment on the tube and the capillary using a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source.
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