Invention Application
- Patent Title: METHOD FOR MEASURING CONCENTRATION OF FLUORINE GAS IN HALOGEN FLUORIDE-CONTAINING GAS USING MASS SPECTROMETER
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Application No.: US17608527Application Date: 2020-11-12
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Publication No.: US20220223397A1Publication Date: 2022-07-14
- Inventor: Atsushi SUZUKI
- Applicant: SHOWA DENKO K.K.
- Applicant Address: JP Tokyo
- Assignee: SHOWA DENKO K.K.
- Current Assignee: SHOWA DENKO K.K.
- Current Assignee Address: JP Tokyo
- Priority: JP2019-214260 20191127
- International Application: PCT/JP2020/042274 WO 20201112
- Main IPC: H01J49/04
- IPC: H01J49/04 ; H01J49/40 ; H01J49/00

Abstract:
A method for measuring the concentration of fluorine gas (F2) contained in a halogen fluoride-containing gas using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method including, before measuring the concentration of fluorine gas, performing passivation treatment on the tube and the capillary using a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source.
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