Invention Application
- Patent Title: Estimation Model Generation Method and Electron Microscope
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Application No.: US17671896Application Date: 2022-02-15
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Publication No.: US20220262595A1Publication Date: 2022-08-18
- Inventor: Ryusuke Sagawa , Shigeyuki Morishita , Fuminori Uematsu , Tomohiro Nakamichi , Keito Aibara
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Priority: JP2021-022197 20210216
- Main IPC: H01J37/153
- IPC: H01J37/153 ; H01J37/28 ; H01J37/26

Abstract:
An aberration value estimator has a learned estimation model for estimating an aberration value set based on a Ronchigram. In a machine learning sub-system, a simulation is repeatedly executed while changing a simulation condition, and calculated Ronchigrams are generated in a wide variety and in a large number. By machine learning using the calculated Ronchigrams, the learned estimation model is generated.
Public/Granted literature
- US11842880B2 Estimation model generation method and electron microscope Public/Granted day:2023-12-12
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