Invention Application
- Patent Title: Phase Control in Contact Formation
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Application No.: US17809922Application Date: 2022-06-30
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Publication No.: US20220352020A1Publication Date: 2022-11-03
- Inventor: Chun-Hsien Huang , I-Li Chen , Pin-Wen Chen , Yuan-Chen Hsu , Wei-Jung Lin , Chih-Wei Chang , Ming-Hsing Tsai
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/532 ; H01L23/522

Abstract:
A method includes forming a first metallic feature, forming a dielectric layer over the first metallic feature, etching the dielectric layer to form an opening, with a top surface of the first metallic feature being exposed through the opening, and performing a first treatment on the top surface of the first metallic feature. The first treatment is performed through the opening, and the first treatment is performed using a first process gas. After the first treatment, a second treatment is performed through the opening, and the second treatment is performed using a second process gas different from the first process gas. A second metallic feature is deposited in the opening
Public/Granted literature
- US12002712B2 Phase control in contact formation Public/Granted day:2024-06-04
Information query
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