Invention Application
- Patent Title: ERROR DETECTION AND CORRECTION IN MEMORY
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Application No.: US17953247Application Date: 2022-09-26
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Publication No.: US20230014459A1Publication Date: 2023-01-19
- Inventor: Joseph M. McCrate , Robert J. Gleixner
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C13/00 ; H03M13/15

Abstract:
The present disclosure includes apparatuses, methods, and systems for error detection and correction in memory. An embodiment includes a memory having a group of self-selecting memory cells which store data corresponding to a codeword from an error correcting code, and circuitry configured to perform a sense operation on the group of self-selecting memory cells, identify, based on the sense operation, memory cells of the group that cannot store data, mark data sensed from the identified memory cells as erasures and perform an error correction operation on data sensed from the group of self-selecting memory cells with the data sensed from the identified memory cells marked as erasures.
Public/Granted literature
- US11868211B2 Error detection and correction in memory Public/Granted day:2024-01-09
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