Invention Publication
- Patent Title: PROBE HEAD AND PROBE CARD COMPRISING SAME
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Application No.: US17912518Application Date: 2021-03-23
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Publication No.: US20230152350A1Publication Date: 2023-05-18
- Inventor: Bum Mo AHN , Sung Hyun BYUN , Dong Hyeok SEO
- Applicant: POINT ENGINEERING CO., LTD.
- Applicant Address: KR Chungcheongnam-do
- Assignee: POINT ENGINEERING CO., LTD.
- Current Assignee: POINT ENGINEERING CO., LTD.
- Current Assignee Address: KR Chungcheongnam-do
- Priority: KR 20200036448 2020.03.25
- International Application: PCT/KR2021/003564 2021.03.23
- Date entered country: 2022-09-18
- Main IPC: G01R1/073
- IPC: G01R1/073
Abstract:
Proposed are a probe head for testing, through a probe, a pattern formed on a wafer, and a probe card having the same. More particularly, proposed are a probe head in which formation of a guide hole into which a probe is inserted and insertion of the probe therein are facilitated, and a probe card having the same.
Public/Granted literature
- US12169212B2 Probe head and probe card comprising same Public/Granted day:2024-12-17
Information query
