Invention Publication
- Patent Title: DIFFERENTIAL AGING MONITOR CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTOR CIRCUITS
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Application No.: US17457207Application Date: 2021-12-01
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Publication No.: US20230168294A1Publication Date: 2023-06-01
- Inventor: Dirk Hammerschmidt , Bernhard Gstoettenbauer , Rafael Zalman , Thomas Zettler , Georg Georgakos , Ludwig Rossmeier , Veit Kleeberger
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/28

Abstract:
In some examples, this disclosure describes a method of operating a circuit. The method may comprise performing a circuit function under normal operating conditions, wherein performing the circuit function under the normal operating conditions includes performing at least a portion of the circuit functions via a characteristic circuit, performing at least the portion of the circuit function under enhanced stress conditions via a characteristic circuit replica, and predicting a potential future problem with the circuit function under the normal conditions based on an evaluation of operation of the characteristic circuit relative to operation of the characteristic circuit replica.
Public/Granted literature
- US11821935B2 Differential aging monitor circuits and techniques for assessing aging effects in semiconductor circuits Public/Granted day:2023-11-21
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