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公开(公告)号：US11821935B2
公开(公告)日：2023-11-21
申请号：US17457207
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Dirk Hammerschmidt , Bernhard Gstoettenbauer , Rafael Zalman , Thomas Zettler , Georg Georgakos , Ludwig Rossmeier , Veit Kleeberger
CPC classification number: G01R31/2642 , G01R31/2815
Abstract: In some examples, this disclosure describes a method of operating a circuit. The method may comprise performing a circuit function under normal operating conditions, wherein performing the circuit function under the normal operating conditions includes performing at least a portion of the circuit functions via a characteristic circuit, performing at least the portion of the circuit function under enhanced stress conditions via a characteristic circuit replica, and predicting a potential future problem with the circuit function under the normal conditions based on an evaluation of operation of the characteristic circuit relative to operation of the characteristic circuit replica.
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公开(公告)号：US20130339819A1
公开(公告)日：2013-12-19
申请号：US13914073
申请日：2013-06-10
Applicant: Infineon Technologies AG
Inventor： Georg Georgakos , Michael Goessel , Egor Sogomonyan
IPC: G06F11/08
CPC classification number: G06F11/08 , G06F11/1008 , H03K19/0033 , H03K19/23
Abstract: Methods and apparatuses relating to error-tolerant memories are provided. In one example embodiment, output signals from at least three memory devices are supplied to an error correction device. The error correction device outputs a corrected data value in such a manner that, when the read data values match, this data value is output and, in at least one state in which the data values do not match, a previously output data value is retained.
Abstract translation: 提供了与容错存储器相关的方法和装置。 在一个示例实施例中，来自至少三个存储器装置的输出信号被提供给纠错装置。 错误校正装置输出校正数据值，使得当读取的数据值匹配时，输出该数据值，并且在数据值不匹配的至少一个状态中保留先前输出的数据值 。
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公开(公告)号：US20230168293A1
公开(公告)日：2023-06-01
申请号：US17457166
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Bernhard Gstoettenbauer , Georg Georgakos , Dirk Hammerschmidt , Veit Kleeberger , Ludwig Rossmeier , Rafael Zalman , Thomas Zettler
CPC classification number: G01R31/2642 , G01R31/2815
Abstract: In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.
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公开(公告)号：US09424124B2
公开(公告)日：2016-08-23
申请号：US13914073
申请日：2013-06-10
Applicant: Infineon Technologies AG
Inventor： Georg Georgakos , Michael Goessel , Egor Sogomonyan
IPC: G11C29/00 , G06F11/08 , H03K19/003 , H03K19/23 , G06F11/10
CPC classification number: G06F11/08 , G06F11/1008 , H03K19/0033 , H03K19/23
Abstract: Methods and apparatuses relating to error-tolerant memories are provided. In one example embodiment, output signals from at least three memory devices are supplied to an error correction device. The error correction device outputs a corrected data value in such a manner that, when the read data values match, this data value is output and, in at least one state in which the data values do not match, a previously output data value is retained.
Abstract translation: 提供了与容错存储器相关的方法和装置。 在一个示例实施例中，来自至少三个存储器装置的输出信号被提供给纠错装置。 错误校正装置输出校正数据值，使得当读取的数据值匹配时，输出该数据值，并且在数据值不匹配的至少一个状态中保留先前输出的数据值 。
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公开(公告)号：US11609265B1
公开(公告)日：2023-03-21
申请号：US17457198
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Ludwig Rossmeier , Georg Georgakos , Bernhard Gstoettenbauer , Dirk Hammerschmidt , Veit Kleeberger , Rafael Zalman , Thomas Zettler
IPC: G01R31/28
Abstract: In some examples, a circuit may be configured to perform a method that includes performing a circuit function via a circuit function unit of a circuit, receiving sensor data from one or more sensors associated with the circuit function unit, and estimating a remaining life of the circuit based on an accelerated reliability model and the sensor data, wherein the sensor data comprises input to the accelerated reliability model. The circuit itself may include a dedicated circuit unit that estimates the remaining life of the circuit based on an accelerated reliability model and the sensor data, and the circuit may output one or more predictive alerts or predictive faults when the remaining life is below a threshold, which may prompt the system for predictive maintenance on the circuit.
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Patent Agency Ranking
公开(公告)号：US11327835B2
公开(公告)日：2022-05-10
申请号：US16944697
申请日：2020-07-31
Applicant: Infineon Technologies AG
Inventor： Georg Georgakos , Michael Goessel
Abstract: In an embodiment, a storage device includes a multiplicity of data value memory cells and a multiplicity of check value memory cells, where at least one of the multiplicity of data value memory cells is assigned to two of the check value memory cells, and where at least one of the multiplicity of check value memory cells is assigned to two of the data value memory cells, and a correction circuit which is configured to output a corrected data value when reading out a selected data value memory cell of the at least one of the multiplicity of data value memory cells, based on a content of the selected data value memory cell and based on contents of the two check value memory cells assigned to the selected data value memory cell.
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7.发明公开公开(公告)号：US20230169250A1
公开(公告)日：2023-06-01
申请号：US17457216
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Veit Kleeberger , Rafael Zalman , Georg Georgakos , Dirk Hammerschmidt , Bernhard Gstoettenbauer , Ludwig Rossmeier , Thomas Zettler
IPC: G06F30/3308
CPC classification number: G06F30/3308
Abstract: In some examples, a method of operating a circuit is described. The method may include performing a circuit function and estimating a probability of failure of the circuit based on one or more stress origination metrics, one or more stress victim events, and one or more initial state conditions.
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8.发明公开公开(公告)号：US20230168295A1
公开(公告)日：2023-06-01
申请号：US17457221
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Georg Georgakos , Bernhard Gstoettenbauer , Dirk Hammerschmidt , Veit Kleeberger , Ludwig Rossmeier , Rafael Zalman , Thomas Zettler
CPC classification number: G01R31/2642 , G01R31/27
Abstract: In some examples, a circuit comprises a function unit configured to perform a circuit function, and one or more in situ monitors configured to measure internal data associated with the circuit. The circuit may further comprise a memory configured to store one or more limit values associated with the one or more in situ monitors, and a lifetime model unit configured to determine whether the circuit has reached an end-of-life threshold based on the measured internal data from the one or more in situ monitors and the limit values.
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公开(公告)号：US11733288B2
公开(公告)日：2023-08-22
申请号：US17457166
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Bernhard Gstoettenbauer , Georg Georgakos , Dirk Hammerschmidt , Veit Kleeberger , Ludwig Rossmeier , Rafael Zalman , Thomas Zettler
CPC classification number: G01R31/2642 , G01R27/02 , G01R27/08 , G01R27/14 , G01R31/2815 , G01L1/20 , G01L1/205 , G01L1/2262
Abstract: In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.
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公开(公告)号：US20230169249A1
公开(公告)日：2023-06-01
申请号：US17457183
申请日：2021-12-01
Applicant: Infineon Technologies AG
Inventor： Thomas Zettler , Rafael Zalman , Georg Georgakos , Dirk Hammerschmidt , Ludwig Rossmeier , Bernhard Gstoettenbauer , Veit Kleeberger
IPC: G06F30/3308
CPC classification number: G06F30/3308
Abstract: In some examples, a method comprises performing a circuit function via a circuit; and estimating a remaining life of the circuit. Moreover, estimating the remaining life of the circuit may include measuring one or more circuit parameters over a period of time during operation of the circuit, and estimating the remaining life of the circuit based on the one or more measured circuit parameters over the period of time during operation of the circuit.
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