Invention Application
- Patent Title: SUBSTRATE PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
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Application No.: US17947922Application Date: 2022-09-19
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Publication No.: US20230018151A1Publication Date: 2023-01-19
- Inventor: Shinya Ishikawa , Toru Hisamatsu
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Priority: JP2019-181500 20191001
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01L21/027 ; H01J37/32

Abstract:
An apparatus for processing a substrate for processing a substrate includes: one or more processing chambers, a plasma generator, and a controller. The controller causes (a) providing a substrate having an etching region and a patterned region on the etching region; (b) forming an organic film on a surface of the substrate; and (c) etching the etching region through the patterned region using plasma generated from a processing gas. The step (b) includes (b1) supplying a first gas containing an organic compound to the substrate to form a precursor layer on the substrate, and (b2) supplying a second gas containing a modifying gas to the substrate and supplying energy to the precursor layer and/or the second gas to modify the precursor layer. In (b2), the precursor layer is modified by plasma generated from the second gas.
Information query
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