- 专利标题: MULTI-FIN FINFET DEVICE INCLUDING EPITAXIAL GROWTH BARRIER ON OUTSIDE SURFACES OF OUTERMOST FINS AND RELATED METHODS
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申请号: US18171914申请日: 2023-02-21
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公开(公告)号: US20230197720A1公开(公告)日: 2023-06-22
- 发明人: Qing LIU , Prasanna KHARE , Nicolas LOUBET
- 申请人: Bell Semiconductor, LLC
- 申请人地址: US PA Bethlehem
- 专利权人: Bell Semiconductor, LLC
- 当前专利权人: Bell Semiconductor, LLC
- 当前专利权人地址: US PA Bethlehem
- 分案原申请号: US16049685 2018.07.30
- 主分类号: H01L27/088
- IPC分类号: H01L27/088 ; H01L21/84 ; H01L29/66 ; H01L29/78 ; H01L29/08 ; H01L21/265 ; H01L29/417 ; H01L21/8238 ; H01L21/225 ; H01L21/8234
摘要:
A multi-fin FINFET device may include a substrate and a plurality of semiconductor fins extending upwardly from the substrate and being spaced apart along the substrate. Each semiconductor fin may have opposing first and second ends and a medial portion therebetween, and outermost fins of the plurality of semiconductor fins may comprise an epitaxial growth barrier on outside surfaces thereof. The FIN FET may further include at least one gate overlying the medial portions of the semiconductor fins, a plurality of raised epitaxial semiconductor source regions between the semiconductor fins adjacent the first ends thereof, and a plurality of raised epitaxial semiconductor drain regions between the semiconductor fins adjacent the second ends thereof.
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