- 专利标题: METHOD FOR MODIFYING INSULATING FILM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
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申请号: US18019924申请日: 2021-08-06
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公开(公告)号: US20230317832A1公开(公告)日: 2023-10-05
- 发明人: Shunpei YAMAZAKI , Fumito ISAKA , Yoichi IIKUBO , Yuji EGI , Yasuhiro JINBO
- 申请人: Semiconductor Energy Laboratory Co., Ltd.
- 申请人地址: JP Atsugi-shi, Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi, Kanagawa-ken
- 优先权: JP 20138573 2020.08.19
- 国际申请: PCT/IB2021/057243 2021.08.06
- 进入国家日期: 2023-02-06
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L21/02
摘要:
A method for modifying an insulating film is provided. The method includes a first step of preparing an insulating film containing hydrogen, and a second step of performing microwave treatment on the insulating film to release the hydrogen in the insulating film as water molecules, so that a hydrogen concentration in the insulating film is reduced. Note that the microwave treatment is preferably performed using an oxygen gas and an argon gas at a temperature range of higher than or equal to 200° C. and lower than or equal to 300° C., and the proportion of the flow rate of the oxygen gas to the total of the flow rate of the oxygen gas and the flow rate of the argon gas is preferably greater than 0 % and less than or equal to 50 %.
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