- 专利标题: TECHNIQUES TO MANUFACTURE FERROELECTRIC MEMORY DEVICES
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申请号: US18203877申请日: 2023-05-31
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公开(公告)号: US20230395113A1公开(公告)日: 2023-12-07
- 发明人: Giorgio Servalli , Marcello Mariani , Agostino Pirovano
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: G11C11/22
- IPC分类号: G11C11/22 ; G11C5/06 ; H10B53/10 ; H10B53/20 ; H01L29/51
摘要:
Methods, systems, and devices for techniques to manufacture ferroelectric memory devices are described. In some cases, a memory array may be manufactured using a self-aligned manufacturing technique. For example, a continuous layer of dielectric material may be formed over an assembly which includes an array of transistors coupling contacts on the surface of the assembly with a set of digit lines. In some cases, an array of cavities may be etched into the dielectric material, each cavity exposing a set of contacts. A set of bottom electrodes corresponding to the set of contacts may be formed on sidewalls in each cavity, for example by depositing a layer of electrode material and etching the electrode material using a variety of hard masks.
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