- 专利标题: APPARATUS AND METHOD FOR MEASURING DEPTH OF THREE-DIMENSIONAL OBJECT
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申请号: US18191384申请日: 2023-03-28
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公开(公告)号: US20230408246A1公开(公告)日: 2023-12-21
- 发明人: Young Sang HA , Ju Hyeong LEE , Sung Jun JOO , Beom Shik KIM , Young Chan KIM
- 申请人: SAMSUNG DISPLAY CO., LTD. , Pusan National University Industry-University Cooperation Foundation
- 申请人地址: KR Yongin-si
- 专利权人: SAMSUNG DISPLAY CO., LTD.,Pusan National University Industry-University Cooperation Foundation
- 当前专利权人: SAMSUNG DISPLAY CO., LTD.,Pusan National University Industry-University Cooperation Foundation
- 当前专利权人地址: KR Yongin-si
- 优先权: KR 20220072580 2022.06.15
- 主分类号: G01B7/26
- IPC分类号: G01B7/26 ; G06T15/00 ; H04N13/275 ; G01S17/08
摘要:
An apparatus for measuring a depth of a three-dimensional (3D) object includes a control unit generating the 3D object by adjusting parameters of a 3D pattern. A 3D display unit displays the 3D object with a preset depth. An input unit generates an input signal based on an input received from a user. A rail extends in a front and a rear of the 3D display unit. A moving body is movable on the rail. Movement of the moving body is adjusted based on the input signal. A distance sensor measures a distance to the moving body.
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