专利检索 ap:("SAMSUNG DISPLAY CO., LTD." OR "Pusan National University Industry-University Cooperation Foundation") AND inv:"Ju Hyeong LEE" 第 1 页

1.

发明公开
APPARATUS AND METHOD FOR MEASURING DEPTH OF THREE-DIMENSIONAL OBJECT 审中-公开

公开(公告)号：US20230408246A1

公开(公告)日：2023-12-21

申请号：US18191384

申请日：2023-03-28

申请人： SAMSUNG DISPLAY CO., LTD. , Pusan National University Industry-University Cooperation Foundation

发明人： Young Sang HA , Ju Hyeong LEE , Sung Jun JOO , Beom Shik KIM , Young Chan KIM

IPC分类号： G01B7/26 , G06T15/00 , H04N13/275 , G01S17/08

CPC分类号： G01B7/26 , G06T15/005 , H04N13/275 , G01S17/08 , G06T2207/10028

摘要： An apparatus for measuring a depth of a three-dimensional (3D) object includes a control unit generating the 3D object by adjusting parameters of a 3D pattern. A 3D display unit displays the 3D object with a preset depth. An input unit generates an input signal based on an input received from a user. A rail extends in a front and a rear of the 3D display unit. A moving body is movable on the rail. Movement of the moving body is adjusted based on the input signal. A distance sensor measures a distance to the moving body.