Invention Application
- Patent Title: SEMICONDUCTOR IMAGING DEVICE HAVING IMPROVED DARK CURRENT PERFORMANCE
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Application No.: US18078455Application Date: 2022-12-09
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Publication No.: US20230109829A1Publication Date: 2023-04-13
- Inventor: Seiji Takahashi , Chen-Jong Wang , Dun-Nian Yaung , Feng-Chi Hung , Feng-Jia Shiu , Jen-Cheng Liu , Jhy-Jyi Sze , Chun-Wei Chang , Wei-Cheng Hsu , Wei Chuang Wu , Yimin Huang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L27/146
- IPC: H01L27/146

Abstract:
In some embodiments, the present disclosure relates to method for forming an image sensor integrated chip. The method includes forming a first photodetector region in a substrate and forming a second photodetector region in the substrate. A floating diffusion node is formed in the substrate between the first photodetector region and the second photodetector region. A pick-up well contact region is formed in the substrate. A first line intersects the floating diffusion node and the pick-up well contact region. One or more transistor gates are formed on the substrate. A second line that is perpendicular to the first line intersects the pick-up well contact region and the one or more transistor gates.
Public/Granted literature
- US12040336B2 Semiconductor imaging device having improved dark current performance Public/Granted day:2024-07-16
Information query
IPC分类: