Invention Application
- Patent Title: THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION GAUGES, THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION METHODS AND THREE-DIMENSIONAL MEASURING APPARATUSES
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Application No.: US17974698Application Date: 2022-10-27
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Publication No.: US20230136366A1Publication Date: 2023-05-04
- Inventor: Yuto INOUE , Masayuki NARA
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Priority: JP2021-177083 20211029
- Main IPC: G01B5/012
- IPC: G01B5/012 ; G01B21/04
Abstract:
A three-dimensional-measuring-apparatus inspection gauge includes a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and a frame member that supports the plurality of targets. The plurality of targets are arranged in positions corresponding to each vertex of a triangular prism.
Public/Granted literature
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