公开(公告)号：US20230136366A1

公开(公告)日：2023-05-04

申请号：US17974698

申请日：2022-10-27

Applicant: MITUTOYO CORPORATION

Inventor： Yuto INOUE ,  Masayuki NARA

IPC: G01B5/012 ,  G01B21/04

Abstract: A three-dimensional-measuring-apparatus inspection gauge includes a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and a frame member that supports the plurality of targets. The plurality of targets are arranged in positions corresponding to each vertex of a triangular prism.

公开(公告)号：US20220107177A1

公开(公告)日：2022-04-07

申请号：US17468830

申请日：2021-09-08

Applicant: MITUTOYO CORPORATION

Inventor： Yuto INOUE

IPC: G01B21/04

Abstract: An error determination apparatus for determining a measurement error that occurs when a workpiece is measured by a coordinate measuring machine, the error determination apparatus includes an information acquisition part that acquires a) motion error information indicating a result of measuring a motion error of the coordinate measuring machine and b) design information of the workpiece, a measurement position specification part that specifies a measurement position on the workpiece on the basis of the design information, an error determination part that determines a measurement error occurring in the measurement at the measurement position due to the motion error on the basis of the motion error information, and an output part that outputs the measurement error determined by the error determination part.

公开(公告)号：US20200072591A1

公开(公告)日：2020-03-05

申请号：US16558730

申请日：2019-09-03

Applicant: MITUTOYO CORPORATION

Inventor： Takeshi HAGINO ,  Yuto INOUE ,  Masayuki NARA

IPC: G01B5/008

Abstract: A measurement point determination method for determining the number or an arrangement of measurement points for a measurement apparatus that performs measurement processing of a measurement item at a plurality of measurement points, the method comprises the steps of acquiring a minimum value and a maximum value of the number of measurement points, acquiring a target value of uncertainty for the measurement item of the measurement apparatus, estimating uncertainties when the measurement item is measured by the measurement apparatus using two or more of the numbers of measurement points between the minimum value and the maximum value of the number of measurement points, and determining the number of measurement points of the measurement apparatus on the basis of the target value and the estimated uncertainties.

公开(公告)号：US20250116497A1

公开(公告)日：2025-04-10

申请号：US18895946

申请日：2024-09-25

Applicant: MITUTOYO CORPORATION

Inventor： Yuto INOUE

IPC: G01B5/008

Abstract: A calibration data acquisition method includes: a first holding step of holding an inspection gauge provided with a plurality of portions to be examined in a first posture with a gauge moving apparatus; a first measuring step of acquiring first distance data by measuring a distance between the plurality of portions to be examined with the three-dimensional measuring apparatus; a second holding step of holding the inspection gauge in a second posture with the gauge moving apparatus, after the first measuring step; a second measuring step of acquiring second distance data by measuring a distance between the plurality of portions to be examined of the inspection gauge in the second posture with the three-dimensional measuring apparatus; and a step of generating calibration data including the first distance data and the second distance data.

公开(公告)号：US20220333920A1

公开(公告)日：2022-10-20

申请号：US17693845

申请日：2022-03-14

Applicant: MITUTOYO CORPORATION

Inventor： Yuto INOUE ,  Masayuki NARA

IPC: G01B21/04 ,  G01B5/008

Abstract: A calibration method includes: measuring, with a CMM, a ball-to-ball distance of a plurality of edges of an inspection gauge installed in a first posture, a second posture and a third posture, and calculating a calibration value calibrating a ball-to-ball distance between two balls at respective ends of a plurality of edges of the inspection gauge by solving simultaneous equations including the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the first posture, the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the second posture, the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the third posture, and a measurement error of the CMM at the measurement position.