- 专利标题: SURFACE EMITTING ELEMENT, METHOD FOR DETECTING OPTIC CHARACTERISTIC, AND METHOD FOR ADJUSTING OPTICAL CHARACTERISTIC
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申请号: US18264698申请日: 2022-01-19
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公开(公告)号: US20240120709A1公开(公告)日: 2024-04-11
- 发明人: EIJI NAKAYAMA , TATSUSHI HAMAGUCHI , KENTARO HAYASHI , RINTARO KODA , HIDEKAZU KAWANISHI
- 申请人: SONY GROUP CORPORATION
- 申请人地址: JP TOKYO
- 专利权人: SONY GROUP CORPORATION
- 当前专利权人: SONY GROUP CORPORATION
- 当前专利权人地址: JP TOKYO
- 优先权: JP 21025083 2021.02.19
- 国际申请: PCT/JP2022/001696 2022.01.19
- 进入国家日期: 2023-08-08
- 主分类号: H01S5/0683
- IPC分类号: H01S5/0683 ; H01S5/042 ; H01S5/06 ; H01S5/068 ; H01S5/183
摘要:
The present technology provides a surface emitting element capable of enabling highly accurate detection of an optical characteristic of an emitted light and/or enabling adjustment of the optical characteristic of the emitted light. The surface emitting element of the present technology provides a surface emitting element including a light emitting layer, a characteristic layer that is disposed on an optical path of light generated in the light emitting layer, exhibits an electrical characteristic due to light incidence, and/or has variability in an optical characteristic due to voltage application, and a plurality of electrodes provided on the characteristic layer.
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