• Patent Title: REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASK
  • Application No.: US18420846
    Application Date: 2024-01-24
  • Publication No.: US20240160096A1
    Publication Date: 2024-05-16
  • Inventor: Yuya NAGATADaijiro AKAGIKenichi SASAKIHiroaki IWAOKA
  • Applicant: AGC Inc.
  • Applicant Address: JP Tokyo
  • Assignee: AGC Inc.
  • Current Assignee: AGC Inc.
  • Current Assignee Address: JP Tokyo
  • Priority: JP 22108643 2022.07.05 JP 23078399 2023.05.11
  • Main IPC: G03F1/24
  • IPC: G03F1/24 G03F1/48
REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASK
Abstract:
A reflective mask blank includes a substrate; a multilayer reflective film that reflects EUV light; a protection film that protects the multilayer reflective film; and a phase shift film that shifts a phase of the EUV light. The substrate, the multilayer reflective film, the protection film, and the phase shift film are arranged in this order. The phase shift film is made of an Ir-based material containing Ir as a main component, and the protection film is made of a Rh-based material containing Rh as a main component.
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