发明公开
- 专利标题: READ DISTURB TRACKING AMONG MULTIPLE ERASE BLOCKS COUPLED TO A SAME STRING
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申请号: US18386760申请日: 2023-11-03
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公开(公告)号: US20240168879A1公开(公告)日: 2024-05-23
- 发明人: Akira Goda , Kishore K. Muchherla , Shyam Sunder Raghunathan , Leo Raimondo , Jung Sheng Hoei , Xiangang Luo , Ashutosh Malshe , Jianmin Huang
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: G06F12/02
- IPC分类号: G06F12/02
摘要:
An apparatus can comprise a memory array comprising a plurality of strings of memory cells each comprising: a first group of memory cells coupled to a first group of access lines and corresponding to a first erase block; and a second group of memory cells coupled to a second group of access lines and corresponding to a second erase block. A controller is configured to determine a cumulative amount of read disturb stress experienced by the first erase block by monitoring read disturb stress experienced by the first erase block due to: read operations performed on the first erase block; read operations performed on the second erase block; and program verify operations performed on the second erase block. The controller can perform an action on the first erase block responsive to the cumulative amount of read disturb stress experienced by the first erase block meeting a criteria.
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