Invention Publication
- Patent Title: ION BEAM CURRENT MEASUREMENT DEVICE AND ION BEAM IMPLANTATION SYSTEM
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Application No.: US18524043Application Date: 2023-11-30
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Publication No.: US20240194444A1Publication Date: 2024-06-13
- Inventor: Moriz Jelinek , Axel König , Bernhard Leitl
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Priority: DE 2022133030.3 2022.12.12
- Main IPC: H01J37/317
- IPC: H01J37/317 ; H01J37/304

Abstract:
An ion beam current measurement device includes a first Faraday cup having a first ion beam entrance slit of a first width W1. The first Faraday cup is configured to generate a first current signal. The device further includes a second Faraday cup having a second ion beam entrance slit of a second width W2. The second Faraday cup is configured to generate a second current signal. The slit widths are designed such that W2 is greater than W1.
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