Invention Publication
- Patent Title: INSPECTION SYSTEM AND METHOD
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Application No.: US18574756Application Date: 2022-07-01
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Publication No.: US20240319114A1Publication Date: 2024-09-26
- Inventor: Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
- Applicant: NUCTECH COMPANY LIMITED
- Applicant Address: CN BEIJING
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN BEIJING
- Priority: CN 2110777657.9 2021.07.09
- International Application: PCT/CN2022/103256 2022.07.01
- Date entered country: 2023-12-28
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/083 ; G01N23/10

Abstract:
An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.
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