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公开(公告)号：US20190204469A1
公开(公告)日：2019-07-04
申请号：US16234632
申请日：2018-12-28
发明人： Hao YU , Ying LI , Weizhen WANG , Quanwei SONG , Dongyu WANG , Haojie CHI , Jianmin LI , Yulan LI , Chunguang ZONG , Zhiqiang CHEN , Yuanjing LI , Li ZHANG
IPC分类号： G01V5/00 , G01N23/203
CPC分类号： G01V5/0025 , G01N23/203
摘要： The present disclosure discloses a vehicle-mounted type back scattering inspection system. The vehicle-mounted type back scattering inspection system includes a carriage and a back scattering imaging device, the scanning range of the back scattering imaging device is variable. As the scanning range of the back scattering imaging device of the present disclosure is variably set, the inspection range of the back scattering imaging device can be expanded.
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公开(公告)号：US20240319112A1
公开(公告)日：2024-09-26
申请号：US18575288
申请日：2022-07-01
发明人： Bicheng LIU , Weizhen WANG , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/02
CPC分类号： G01N23/02 , G01N2223/1006 , G01N2223/206 , G01N2223/64
摘要： The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.
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公开(公告)号：US20240085349A1
公开(公告)日：2024-03-14
申请号：US18259772
申请日：2021-12-15
发明人： Zhiqiang CHEN , Lei LIU , Shangmin SUN , Chunguang ZONG , Yu HU , Yuan MA , Zheng JI
CPC分类号： G01N23/04 , G01N23/10 , G01V5/0016
摘要： The present disclosure provides a radiation inspection system, including a container respectively provided with an entrance and an exit on opposite side walls thereof; and a radiation scanning imaging device disposed in the container and having an inspection channel. The radiation scanning imaging device includes a ray source, the ray source includes ray generators, and ray generators are configured to emit ray beams at different angles, so that the radiation scanning imaging device performs radiation scanning inspection on an object to be inspected passing through the inspection channel from the entrance to the exit.
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公开(公告)号：US20230288350A1
公开(公告)日：2023-09-14
申请号：US18013555
申请日：2021-07-02
发明人： Zhiqiang CHEN , Yuanjing LI , Shangmin SUN , Chunguang ZONG , Yu HU , Huaping TANG , Bicheng LIU , Weizhen WANG
IPC分类号： G01N23/203
CPC分类号： G01N23/203 , G01N2223/316 , G01N2223/3301 , G01N2223/501
摘要： The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.
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公开(公告)号：US20210364455A1
公开(公告)日：2021-11-25
申请号：US17255968
申请日：2020-01-03
发明人： Jianmin LI , Li ZHANG , Yuanjing LI , Zhiqiang CHEN , Hao YU , Shangmin SUN , Bicheng LIU , Weizhen WANG , Dongyu WANG , Yuan MA , Yu HU , Chunguang ZONG
IPC分类号： G01N23/20008 , G01N23/203
摘要： The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
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公开(公告)号：US20190204242A1
公开(公告)日：2019-07-04
申请号：US16234621
申请日：2018-12-28
发明人： Xiulin NI , Jianmin LI , Haitian TAN , Yulan LI , Weifeng YU , Yuanjing LI , Hejun ZHOU , Zhiqiang CHEN , Chunguang ZONG , Li ZHANG
IPC分类号： G01N23/046 , G01V5/00
CPC分类号： G01N23/046 , G01N2223/401 , G01V5/005
摘要： The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a non-uniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.
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7.发明申请Standing Wave Electron Linear Accelerator and Container/Vehicle Inspection System 审中-公开驻波电子线性加速器和集装箱/车辆检测系统公开(公告)号：US20160135278A1
公开(公告)日：2016-05-12
申请号：US14900601
申请日：2013-11-19
发明人： Shangmin SUN , Zhanfeng QIN , Sheng YAO , Weifeng YU , Liwei SONG , Chunguang ZONG , Jinning LIANG
CPC分类号： H05H7/02 , G01V5/0016 , H05H9/048 , H05H2007/027
摘要： The present invention provides a standing wave electron linear accelerator comprising a modulator and a magnetron for producing radio frequency microwaves; a plurality of accelerating tubes for accelerating electrons; a microwave transmission system for feeding the microwaves into the plurality of accelerating tubes; a plurality of electron guns for emitting electron beams into the plurality of accelerating tubes; a plurality of targets impinged by the electrons from a plurality of accelerating tubes to form continuous spectrums of X-rays; a plurality of shielding devices for shielding the continuous spectrums of X-rays generated by the targets; and a microwave distributor disposed adjacent to the end of the microwave transmission system, wherein the microwave distributor has a microwave inlet and a plurality of microwave outlets for distributing the microwaves in the microwave transmission system into the accelerating tubes.
摘要翻译： 本发明提供了一种驻波电子线性加速器，其包括用于产生射频微波的调制器和磁控管; 用于加速电子的多个加速管; 微波传输系统，用于将微波馈送到多个加速管中; 多个电子枪，用于将电子束发射到多个加速管中; 由多个加速管撞击的电子的多个靶，以形成X射线的连续光谱; 多个屏蔽装置，用于屏蔽目标产生的X射线的连续光谱; 以及布置在所述微波传输系统的端部附近的微波分配器，其中所述微波分配器具有微波入口和用于将所述微波传输系统中的微波分配到所述加速管中的多个微波出口。
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公开(公告)号：US20240319114A1
公开(公告)日：2024-09-26
申请号：US18574756
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/04 , G01N23/083 , G01N23/10
CPC分类号： G01N23/04 , G01N23/083 , G01N23/10 , G01N2223/204 , G01N2223/50
摘要： An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.
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公开(公告)号：US20240302299A1
公开(公告)日：2024-09-12
申请号：US18575301
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/083 , G01N23/04 , H01J25/50
CPC分类号： G01N23/083 , G01N23/04 , G01N2223/20 , H01J25/50
摘要： An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.
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公开(公告)号：US20220082723A1
公开(公告)日：2022-03-17
申请号：US17420132
申请日：2020-01-03
发明人： Quanwei SONG , Xuping FAN , Junping SHI , Yuan HE , Hui MENG , Chunguang ZONG , Yu HU , Shangmin SUN , Jinguo CAO
IPC分类号： G01V5/00
摘要： The present disclosure relates to a security inspection device and a transfer method, and the security inspection device includes an arm frame, provided with detectors, and configured to form an inspection channel, a first compartment, internally provided with a radiation source and connected with the arm frame, a protection wall, connected with the first compartment or the arm frame, and configured to perform radiation protection for an object to be protected, and a tire, configured to enable the security inspection device to move relative to the ground, and the arm frame, the first compartment and the protection wall are set to be transported together in a connected state.
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