Invention Application
- Patent Title: MAGNETIC TUNNELING JUNCTION WITH SYNTHETIC FREE LAYER FOR SOT-MRAM
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Application No.: US18912177Application Date: 2024-10-10
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Publication No.: US20250040447A1Publication Date: 2025-01-30
- Inventor: Chien-Min Lee , Shy-Jay Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H10N52/80
- IPC: H10N52/80 ; H01F10/32 ; H01F41/30 ; H10N50/01 ; H10N50/10 ; H10N50/80 ; H10N50/85 ; H10N52/00 ; H10N52/01

Abstract:
A magnetic memory device includes a spin-orbit torque (SOT) induction spin Hall electrode and a free layer of a magnetic tunnel junction (MTJ) stack disposed on the spin Hall electrode which is a synthetic anti-ferromagnetic structure. The free layer has a magnetic moment which is askew of the long axis of the MTJ stack and askew the direction of current flow through the spin Hall electrode. The MTJ stack internally generates a magnetic field to switch the state of the free layer. The free layer includes a first layer separated from a second layer by a spacer layer, where the first layer and the second layer may have the same or different crystalline structures.
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