Invention Application
- Patent Title: Image-Based Assay Using Mark-Assisted Machine Learning
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Application No.: US18915106Application Date: 2024-10-14
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Publication No.: US20250150692A1Publication Date: 2025-05-08
- Inventor: Stephen Y. Chou , Wei Ding , Yufan Zhang , Ji Qi , Jun Tian , Wei Dong
- Applicant: Essenlix Corporation
- Applicant Address: US NJ Monmouth Junction
- Assignee: Essenlix Corporation
- Current Assignee: Essenlix Corporation
- Current Assignee Address: US NJ Monmouth Junction
- Main IPC: H04N23/51
- IPC: H04N23/51 ; G01N21/84 ; H04N23/55 ; H04N23/56 ; H04N23/57

Abstract:
The present disclosure relates to devices, apparatus and methods of improving the accuracy of an image-based assay. One aspect of the present invention is to sandwich a sample between two plates and add reference marks in the sample areas of the plates, with at least one of the geometric and/optical properties of the reference marks being predetermined and known, and taking images of the sample with the reference marks, and applying a machine learning model in the analysis of the image-based assay.
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