公开(公告)号：US12265019B2

公开(公告)日：2025-04-01

申请号：US17268677

申请日：2019-08-16

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Jun Tian

IPC: G01N21/31 ,  G01N21/01 ,  G02B21/00 ,  G02B21/06 ,  G02B21/18 ,  H04N23/56 ,  H04N23/57 ,  H04M1/02

Abstract: Disclosed is an optical system for interrogating a sample, an optical system for measuring the spectrum of a beam of light, an optical system for measuring the spectrum of two beams of light, a compact imaging-based sensor or sensors, and combinations thereof.

公开(公告)号：US20240309369A1

公开(公告)日：2024-09-19

申请号：US18388193

申请日：2023-11-09

Applicant: Essenlix Corporation

Inventor： Stephen Y. CHOU ,  Wei DING ,  Ji QI ,  Jun Tian ,  Wu Chou

IPC: C12N15/113 ,  A61K31/7088 ,  A61K45/06 ,  A61K47/54 ,  A61P31/04

CPC classification number: C12N15/113 ,  A61K31/7088 ,  A61K45/06 ,  A61K47/554 ,  A61P31/04 ,  C12N15/1137 ,  C12N2310/127 ,  C12N2310/3515 ,  C12Y305/02006

Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.

公开(公告)号：US11933720B2

公开(公告)日：2024-03-19

申请号：US17621216

申请日：2020-06-22

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Jun Tian ,  Wu Chou ,  Hongbing Li

IPC: G01N21/31 ,  G01N21/03

CPC classification number: G01N21/31 ,  G01N21/03 ,  G01N2021/0346 ,  G01N2021/3129

Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.

公开(公告)号：US11733151B2

公开(公告)日：2023-08-22

申请号：US17284083

申请日：2020-04-06

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wu Chou ,  Xing Li ,  Hongbing Li ,  Yuecheng Zhang ,  Mingquan Wu ,  Wei Ding ,  Jun Tian

IPC: G01N15/14 ,  G06T7/62 ,  G06T7/00 ,  G06T7/40 ,  G06T7/10 ,  G06N20/00

CPC classification number: G01N15/1475 ,  G06N20/00 ,  G06T7/0012 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62 ,  G06T2207/10056 ,  G06T2207/30004 ,  G06T2207/30024 ,  G06T2207/30204

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.

公开(公告)号：US20250150692A1

公开(公告)日：2025-05-08

申请号：US18915106

申请日：2024-10-14

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Qi ,  Jun Tian ,  Wei Dong

IPC: H04N23/51 ,  G01N21/84 ,  H04N23/55 ,  H04N23/56 ,  H04N23/57

Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of an image-based assay. One aspect of the present invention is to sandwich a sample between two plates and add reference marks in the sample areas of the plates, with at least one of the geometric and/optical properties of the reference marks being predetermined and known, and taking images of the sample with the reference marks, and applying a machine learning model in the analysis of the image-based assay.

公开(公告)号：US11846582B2

公开(公告)日：2023-12-19

申请号：US17858931

申请日：2022-07-06

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Jun Tian ,  Wu Chou

IPC: G01N21/03 ,  G01N1/28 ,  G01N21/25 ,  G01N21/64 ,  G01N33/49

CPC classification number: G01N21/0303 ,  G01N1/2813 ,  G01N21/25 ,  G01N21/6458 ,  G01N33/49 ,  G01N2021/035 ,  G01N2021/6439 ,  G01N2201/0221

Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.

公开(公告)号：US11463608B2

公开(公告)日：2022-10-04

申请号：US17179319

申请日：2021-02-18

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Qi ,  Jun Tian ,  Wei Dong

IPC: H04N5/225 ,  G01N21/84

Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of an image-based assay. One aspect of the present invention is to sandwich a sample between two plates and add reference marks in the sample areas of the plates, with at least one of the geometric and/optical properties of the reference marks being predetermined and known, and taking images of the sample with the reference marks, and applying a machine learning model in the analysis of the image-based assay.

公开(公告)号：US20210140957A1

公开(公告)日：2021-05-13

申请号：US16621185

申请日：2018-06-12

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Yufan Zhang ,  Ji Li ,  Ji Qi ,  Jun Tian

IPC: G01N33/543 ,  G06T7/00

Abstract: Among other things, the present invention is related to devices and methods of performing biological and chemical assays, such as but not limited to immunoassays and nucleic assay acid, particularly the homogeneous assay that does not use the step of wash and that is fast (e.g. 60 seconds from dropping a sample to displaying results).

公开(公告)号：US10955334B2

公开(公告)日：2021-03-23

申请号：US16771502

申请日：2018-12-14

Applicant: Essenlix Corporation

Inventor： Stephen Chou ,  Wei Ding ,  Ji Qi ,  Jun Tian ,  Wu Chou

IPC: G01N21/03 ,  G01N1/28 ,  G01N21/25 ,  G01N21/64 ,  G01N33/49

Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.

公开(公告)号：US20200378886A1

公开(公告)日：2020-12-03

申请号：US16771502

申请日：2018-12-14

Applicant: Essenlix Corporation

Inventor： Stephen CHOU ,  Wei DING ,  Ji QI ,  Jun Tian ,  Wu Chou

IPC: G01N21/03 ,  G01N21/25 ,  G01N21/64 ,  G01N33/49 ,  G01N1/28

Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.