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US4348723A Control store test selection logic for a data processing system 失效
用于数据处理系统的控制存储测试选择逻辑

Control store test selection logic for a data processing system
摘要:
A first bank or a second bank of storage locations of a control store of a data processing system is enabled in response to one of a plurality of test signals received as parallel inputs by two multiplexer devices. Only one of the multiplexers is enabled at a given time in response to the polarity of one of the test signals selected from the inputs of the multiplexer devices.
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